WILSONVILLE, Ore. and SAN JOSE, Calif. -- August 19, 2009 – Mentor Graphics Corporation (NASDAQ: MENT) and LogicVision, Inc. (NASDAQ: LGVN) today announced that LogicVision stockholders have voted ...
This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...
Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...
Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.