Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how ...

Balancing reliability against cost is becoming more difficult for semiconductor test, as chip complexity increases and devices become more domain-specific. Tests need to be efficient and effective ...

Probe card demand for 3D ICs is promising, according to IC testing interface solution provider Chunghwa Precision Test Tech (CHPT), which also claimed it will be one of the new suppliers... Testing ...

An effective semiconductor test strategy extends from individual test cells comprising ATE systems, wafer probers, test contactors, and handlers up to supply-chain-wide software tools that can analyze ...

Yokogawa Electric Corp. has developed a flat panel display (FPD) driver IC test system that supports high-speed interfaces. The ST6731, which will be available in March 2011, that supports interfaces ...